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TESCAN TENSOR is the world’s first dedicated 4D-STEM

for multimodal characterization of nanoscale morphological, chemical, and structural properties of functional materials, thin films, and synthetic particles, with stand-out 4D-STEM performance and unprecedented usability.

• Synchronization of Scanning with Diffraction Imaging, EDS Acquisition and Beam Blanking.

• Integrated, Near Real-Time 4D-STEM data Analysis and Processing

• Performance benefits from Electron Beam Precession and near-UHV

• A novel approach to STEM User Experience

Analytical 4D-STEM

The full picture of electron beam - specimen interaction
4D-STEM is the microscopy method of choice for true nanoscale, multimodal characterization of material properties such as morphology, chemistry, and structure. At each pixel in the STEM dataset, TESCAN TENSOR acquires a diffraction pattern and an EDS spectrum, fast and perfectly synchronized. Together, diffraction and spectroscopy data encapsulate the full picture of electron beam - specimen interaction, from which a wide range of material properties can be derived.